The mission of Czech Metrology institute is not only to perform research in metrology but
above all to realize traceability for other subjects and thus guarantee unification and correctness of measurement
in Czech Republic.
Metrology system, which is established at nanometrology department is a demanding challenge in the field of fundamental
metrology, but the main goal is to provide traceability for others and for any physical quantities measured by high resolution.
Among most simple services which we can provide to the expert public is calibration of various elalons used
in microscopy techniques (SPM, SEM, optical microscopy) and morphology measurement
micro- and nanostructures generally as well as calculation of various direct and/or statistical parameters and functions such as
Considering that the aim of our research focuses not only at length measurement we can offer consultation
and cooperation also on measurement of
other physical quantities (electrical, magnetic, temperature, optical)
at high resolution and measurement of mechanical quantities in nano- and microscale.