SPM workshop 2017
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Download the abstracts here.
Programme
Registration: Wed, 13:00 – 14:00
Opening: Wed, 14:00 – 14:10
| Wed 14:10 – 14:50 |
Andrew Yacoot |
Aspects of metrological atomic force microscopy |
| Wed 14:50 – 15:10 |
Marek Havlíček |
Towards magnetic force microscopy traceability |
| Wed 15:10 – 15:30 |
Jan Neuman |
Correlative Probe and Electron Microscopy (CPEM) with SPM LiteScope, NenoVision |
| Wed 15:30 – 15:50 |
Dušan Novotný |
Měřicí technika Morava s.r.o. company presentation |
| Wed 15:50 – 16:10 |
|
Coffee break |
| Wed 16:10 – 16:50 |
Bernd Kästner |
Nano-FTIR spectroscopy at the Metrology Light Source (MLS) |
| Wed 16:50 – 17:10 |
Sergiu Amarie |
nano-FTIR - imaging and spectroscopy at 10nm spatial resolution |
| Wed 17:10 – 17:30 |
Alžběta Kokaislová |
Scanning near-field infrared microscopy for investigation of hydrogenated single-wall carbon nanotubes |
| Wed 17:30 – 17:50 |
Marek Černík |
Multi-Modal Raman-AFM Imaging |
| Wed 17:50 – 18:10 |
Martin Schaefer |
New Tools for SPM in UHV, High Vacuum, Liquid or Ambient Environments |
| Wed 19:00 – 20:00 |
|
Dinner |
| Thu 9:00 – 9:20 |
Jan Přibyl |
Use of AFM for nanomechanical mapping of living cells, biomolecules and biomaterials |
| Thu 9:20 – 9:40 |
Lenka Zajíčková |
Single-cell force spectroscopy measurement of cell adhesion to cyclopropylamine plasma polymer films |
| Thu 9:40 – 10:00 |
Jan Vávra |
Optical Tweezers combined with Atomic Force Microscopy - the next level force tool for bio applications |
| Thu 10:00 – 10:20 |
Samuel Lesko |
PeakForce Scanning Electrochemical Microscopy (SECM) with Nanoelectrode Probes |
| Thu 10:20 – 10:40 |
|
Coffee break |
| Thu 10:40 – 11:20 |
Stefan Müllegger |
Radio-frequency scanning tunneling microscopy on molecular and atomic resonators |
| Thu 11:20 – 11:40 |
Ondřej Krejčí |
Principles and simulations of high-resolution STM imaging with a flexible tip apex. |
| Thu 11:40 – 12:00 |
María Moro-Lagares |
High-resolution AFM/STM imaging and spectroscopy of Van der Waals interaction of CO on a Ag(111) metal surface |
| Thu 12:00 – 12:20 |
Dušan Novotný |
Měřicí technika Morava s.r.o. company presentation |
| Thu 12:20 – 14:00 |
|
Lunch |
| Thu 14:00 – 14:20 |
Pavel Kocán |
Molecular self-assembly controlled by the electric field of an STM tip |
| Thu 14:20 – 14:40 |
Jan Berger |
Control of multiple electron charge states within a single molecule |
| Thu 14:40 – 15:00 |
Aleš Cahlík |
Resolving molecular products of astro-photochemistry: light-induced hydrogenation of 1,2-bis(2-phenylethynyl)benzene |
| Thu 15:00 – 15:20 |
Bruno de la Torre |
Simultaneous high-resolution AFM/STM/IETS imaging of FePc on Au(111) |
| Thu 15:20 – 15:40 |
Martin Ondráček |
Electrostatic properties of CO functionalized tips |
| Thu 15:40 – 16:00 |
Peter Matvija |
Real-space visualization of the pair correlation function in a 2D molecular gas |
| Thu 16:00 – 16:20 |
|
Coffee break |
| Thu 16:20 – 17:00 |
Jonathan Weaver |
Scanning Thermal Microscope Probes for Accurate Thermometry |
| Thu 17:00 – 17:20 |
Jan Martinek |
Large area SThM/IR system for temperature and thermal conductivity mapping |
| Thu 17:20 – 17:40 |
Petr Klapetek |
Graphics card based computing for an inverse problem solution |
| Thu 17:40 – 18:00 |
Łukasz Zarodkiewicz |
MSA System – A Closer Look At nanotechnology |
| Thu 18:00 – 18:05 |
Filip Jakeš |
RMI company presentation |
| Thu 18:05 – 18:20 |
Sergey Lemeshko |
NT-MDT New developments in scanning probe microscopy and tip enhanced microscopies |
| Thu 19:00 – 23:00 |
|
Social evening |
| Fri 9:30 – 10:10 |
Theodor Gotszalk |
Nanometrology using piezoresitive scanning probe microscopy cantilevers |
| Fri 10:10 – 10:30 |
Matěj Hývl |
Investigation of shunt propagation in radial junction solar cells with c-AFM |
| Fri 10:30 – 10:50 |
David Roesel |
Characterization of wide bandgap semiconductors by scanning probe microscopies |
| Fri 10:50 – 11:10 |
Martin Švec |
Converse piezoelectric effect in structural analogs of helicene |
| Fri 11:10 – 11:30 |
|
Coffee break |
| Fri 11:30 – 11:50 |
Daniel Haško |
Optimisation of process conditions of layers and structures for hybrid organic - inorganic photonics. |
| Fri 11:50 – 12:10 |
Anna Charvátová Campbell |
Correction of nanoindentations data based on AFM surface topography measurements |
| Fri 12:10 – 12:30 |
Jiří Šperka |
Open SPM data sources from space missions |
| Fri 12:30 – 12:50 |
Vlastimil Píč |
Macromodel of AFM / SPM |
| Fri 12:50 – 13:10 |
Jan Fait |
Complex nano-patterning of amorphous silicon thin films by scanning probe |
| Fri 13:10 |
|
End of the workshop, lunch |
Topics
- Novel SPM modes and devices
- UHV STM and AFM
- SPM applications for different physical quantities
- Instrumentation development and metrology
- SPM data processing
Preliminary list of invited speakers
- Bernd Kästner, Physikalisch Technische Bundesanstalt, Germany, "Nano-FTIR spectroscopy at the Metrology Light Source"
- Andrew Yacoot, National Physical Laboratory, United Kingdom, "Aspects of metrological atomic force microscopy"
- Stefan Müllegger, Johannes Kepler University Linz, Austria, "Radio-frequency scanning tunneling microscopy on molecular and atomic resonators"
- Theodor Gotszalk, Wroclaw University of Technology, Poland, "Nanometrology using piezoresitive scanning probe microscopy cantilevers"
- Jonathan Weaver, University of Glasgow, United Kingdom, "Scanning Thermal Microscope Probes for Accurate Thermometry"
Sponsors and exhibitors
- MT-M (main sponzor), representing Bruker, SPECS
- NenoVision
- Nicolet CZ, representing Neaspec
- RMI (NT–MDT)
- Schaefer Technologie GmbH, representing AFMWorkshop, Cytosurge, Park Systems, and RHK Technology
- Uni-Export Instruments, representing Witec
- JPK Instruments
- MSA System
Accomodation
For accomodation we recommend Hotel Lednice. We expect participants
to book and pay the accomodation by themselves. Please note that the capacity of the hotel is limited (first come, first serve).
Another accomodation possibilies in Lednice are listed on Lednice pages.
Even if Lednice is a small town, there are plenty of possibilities within walking distance from the workshop venue.
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