SPM workshop 2019
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Download the abstracts here.
Programme
Registration: Wed, 12:00 – 13:00
Opening: Wed, 13:00 – 13:10
| Wed 13:10 – 13:50 |
Fernando Araujo de Castro |
Towards 3D nanoscale imaging of complex thin films using scanning probe microscopy |
| Wed 13:50 – 14:30 |
Denis Vasyukov |
Introduction to Scanning Microwave Microscopy |
| Wed 14:30 – 14:50 |
Anna Charvátová Campbell |
Nanoindentor tip analysis by AFM |
| Wed 14:50 – 15:10 |
Dušan Novotný |
Měřicí technika Morava s.r.o. company presentation |
| Wed 15:10 – 15:30 |
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Coffee break |
| Wed 15:30 – 15:50 |
Teodor Gotszalk |
Array of electromagnetically cantilevers for force-distance spectroscopy metrological investigations |
| Wed 15:50 – 16:10 |
Daniel Haško |
Measurement of the elastic properties of soft samples in fluids |
| Wed 16:10 – 16:30 |
Vilma Buršíková |
Characterisation of plasma-polymer organosilicon composite thin films deposited under dusty plasma conditions |
| Wed 16:30 – 16:50 |
Jiří Buršík |
Local mechanical properties of advanced thermoelectrics |
| Wed 16:50 – 17:10 |
Egor Ukraintsev |
Peak Force AFM study of a chiral helicene-based macrocycles assembly on HOPG |
| Wed 17:10 – 17:30 |
David Nečas |
Tip dilation artefacts & roughness measurement – parametric approach |
| Wed 17:30 – 17:50 |
Filip Jakeš |
RMI company presentation |
| Wed 18:00 – 19:00 |
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Dinner |
| Thu 9:00 – 9:40 |
Volker Neu |
Probing magnetic textures on the nanoscale |
| Thu 9:40 – 10:00 |
Matěj Hývl |
Contact force in C-AFM |
| Thu 10:00 – 10:20 |
Jaroslav Kuliček |
Microscopic surface potential study for understanding ionic migration in perovskites |
| Thu 10:20 – 10:40 |
Dušan Novotný |
Měřicí technika Morava s.r.o. company presentation |
| Thu 10:40 – 11:00 |
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Coffee break |
| Thu 11:00 – 11:40 |
Yannick De Wilde |
Near-field investigation of plasmonic materials and devices at infrared wavelengths |
| Thu 11:40 – 12:00 |
Petr Klapetek |
FDTD calculations of infrared SNOM probes |
| Thu 12:00 – 12:20 |
Jan Vávra |
Scattering-Type Scanning Near-field Optical Microscopy and Spectroscopy for Nanoscale Chemical Analysis - company presentation |
| Thu 12:30 – 14:50 |
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Lunch & group photo |
| Thu 14:50 – 15:10 |
Radovan Vraník |
Mechanical response of helicene molecules on Ag(111) substrate to RF pulses
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| Thu 15:10 – 15:30 |
Mihai-George Mureșan |
AFM measurements of laser-induced damaged sites |
| Thu 15:30 – 15:50 |
Bohuslav Rezek |
Nano-analysis of composition and photovoltaic properties of nanodiamonds with polypyrrole |
| Thu 15:50 – 16:10 |
Łukasz Zarodkiewicz |
MSA System company presentation |
| Thu 16:10 – 16:30 |
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Coffee break |
| Thu 16:30 – 16:50 |
Ivan Ošťádal |
Cleaning tungsten STM tips for UHV measurements |
| Thu 16:50 – 17:10 |
Pavel Kocan |
Electric field of an STM tip as a tool for probing stability of molecular layers |
| Thu 17:10 – 17:30 |
Jiří Doležal |
Metastability of a copper phthalocyanine molecule on a thin insulating NaCl layer |
| Thu 17:30 – 17:50 |
Taras Chutora |
On-surface synthesis of ethynylene bridged anthracene polymers |
| Thu 17:50 – 18:10 |
Benjamin Mallada |
Atomic-scale study of impact of Boron and Nitrogen dopants in graphene chemical reactivity by STM/AFM/KPFM and DFT calculations. |
| Thu 18:10 – 18:30 |
Zdeněk Nováček |
LiteScope™ AFM-in-SEM: New applications and tools for in-situ sample analysis - company presentation |
| Thu 19:00 – 23:00 |
|
Social evening |
| Fri 9:20 – 9:30 |
Lukáš Fojt |
Characterization of carbon-based electrodes using AFM and Raman spectroscopy techniques |
| Fri 9:30 – 9:50 |
Marek Havlíček |
Polymer spheres calibration for use in particle counters done by AFM |
| Fri 9:50 – 10:10 |
Jan Martinek |
SThM and infrared microscope calibration method |
| Fri 10:10 – 10:30 |
Jan Vaniš |
Characterization of ZnO nanorod heterostructures |
| Fri 10:30 – 10:50 |
Marek Černík |
alpha300Ri Inverted 3D Confocal Raman Microscopy - company presentation |
| Fri 10:50 – 11:10 |
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Coffee break |
| Fri 11:10 – 11:30 |
Dušan Hemzal |
Noble metal nanoparticles as template for successful characterization of biomolecules |
| Fri 11:30 – 11:50 |
Jan Přibyl |
AFM based spectroscopy for nanomechanical mapping of living cells, biomolecules and biomaterials |
| Fri 11:50 – 12:10 |
Tomáš Finsterle |
Microscopic study change of adhesion after drug exposure on surface coating with diamond and gold nanoparticles |
| Fri 12:10 – 12:30 |
Dušan Novotný |
Měřicí technika Morava s.r.o. company presentation |
| Fri 12:30 |
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End of the workshop, lunch |
Topics
- Novel SPM modes and devices
- UHV STM and AFM
- SPM applications for different physical quantities
- Instrumentation development and metrology
- SPM data processing
List of invited speakers
- Fernando Araujo de Castro, National Physical Laboratory, United Kingdom
- Volker Neu, IFW Dresden, Germany
- Yannick De Wilde, ESPCI, France
- Denis Vasyukov, METAS, Switzerland
Séverine GOMES, INSA Lyon, France
Sponsors and exhibitors
- MT-M (main sponzor), representing Bruker, SPECS, JPK Instruments and other companies
- NenoVision
- Uni-Export Instruments, representing Witec
- RMI (NT–MDT)
- Nicolet CZ, representing Neaspec
- MSA System
- Schaefer Technologie GmbH
Accommodation
For accomodation we recommend Hotel Lednice. We expect participants
to book and pay the accomodation by themselves. Please note that the capacity of the hotel is limited (first come, first serve).
Another accomodation possibilies in Lednice are listed on Lednice pages.
Even if Lednice is a small town, there are plenty of possibilities within walking distance from the workshop venue.
Registration
Registration is closed.
Book of abstracts
Downloadable in PDF from http://nanometrologie.cz/sbornik_2019.pdf
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(c) CMI 2014
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News
2020-02-28 New FDTD solver version GSvit 1.9.4 was released.
2019-06-11 New FDTD solver version GSvit 1.9.3 was released.
2019-10-12 New FDTD solver version GSvit 1.9.2 was released.
Image of the month
SiOx nanocomposite film deposited in dusty plasma
Contact
Department of nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
pklapetek(at)cmi.cz
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