SPM workshop 2025

We coridally invite you to the next SPM workshop that will take place between 23rd and 25th April 2025 at Hotel Lednice, just in front of the Unesco national heritage monument Lednice castle. Workshop is organized by Department of primary nanometrology and technical length, Czech Metrology Institute.

The main aim of the workshop is to give an opportunity to meet with all the colleagues working on SPM fields in Central European region, share results and discuss the novel research topics.

Programme

The workshop consists of a set of invited lectures (30 min + 6 min for discussion) and participants oral presentations (15 min + 3 min for discussion). A social evening programme is organized with financial support of the workshop sponsors. The workshop starts on Wednesday, 23 April at 14 p.m. and finishes on Friday, 25 April early afternoon.

Wednesday, 23 April
13:00 Registration
13:55 Welcome
SPM for electrical, magnetic and mechanical properties
14:00 M. Hývl Contact force in current-detecting atomic force microscopy
14:18 J. Šoltýs MFM tip-controlled magnetization of magnetic nanostructures
14:36 E. Arbelo Park Systems company presentation
14:54 P. Klapetek Advanced measurement modes in Gwyscope controller
15:12 D. Badura Scanning probe microscope with active piezoresistive cantilever for versatile surface metrology
15:30 D. Novotný News from MT-M (Měřicí technika Morava company presentation)
15:50 COFFEE BREAK
Self-sensing cantilevers
16:20 T. Gotszalk Metrology with MEMS devices
16:56 B. Pruchnik Higher eigenmode atuation of active piezoresistive cantilevers for surface nanometrology
17:14 A. Sierakowski Piezoresistive technology as universal tool for various self-sensing microstructures
17:32 W. Kopczyński Active piezoresistive cantilevers in nanorobotics
17:50 J. Horák News from Bruker (Měřicí technika Morava company presentation)
18:15 DINNER
19:00 Exhibitors Experience the AFM: practical demonstration of instruments and free discussion with company representatives
Thursday, 24 April
Atomistic phenomena
9:00 M. Setvín Imaging and tracking polarons in Fe2O3 and SrTiO3 by atomic force microscopy
9:36 P. Jelínek Observables in STM: can we see molecular orbitals?
9:54 E. Ukraintsev AFM, FFMD simulations and CD analyses of [7]-helicene assembly on ZnO polar and non-polar facets.
10:12 M. Rejhon Exploring ABC-stacked graphene domains in untwisted epitaxial graphene
10:30 K. Šec Nanoscale optical and chemical characterization of nanomaterials using s-SNOM technology (Nicolet CZ company presentation)
10:50 COFFEE BREAK
Beyond standard measurements and analysis
11:20 G. Heath Localization atomic force microscopy
11:56 B. Papulová Use of localized atomic force microscopy to improve imaging resolution
12:14 P. Klok Nanoscale time-resolved photoluminescence mapping of CsPbBr3 nanocrystals via near-field optical microscopy
12:32 M. Černík Correlative Raman-AFM (Uni-Export Instruments company presentation)
12:50 LUNCH
Advanced and correlative measurements
14:00 G. Fantner Scanning Ion Conductance Microscopy and Spectroscopy
14:36 B. Hoogenboom Surface roughness analysis by atomic force microscopy (Nanosurf company presentation)
14:54 O. Novotný Development of an in-situ methodology for the measurement of sensitive materials (Nenovision company presentation)
15:12 J. Hruška Atomic force microscopy combined with scanning electron microscopy in life sciences
15:30 COFFEE BREAK
Bio-AFM
16:00 J. Přibyl Multiscale analysis of biological systems: integrating imaging, mechanical characterization, and chemical profiling
16:18 J. Máčala Dual-organoid biosensor for monitoring cardiac conduction disturbances in vitro
16:36 B. Brázdilová Standardization of methods for characterization of mechanical properties of soft samples at nanoscale
16:54 R. Obořilová AFM spectroscopy for the study of lipid bilayer stability and morphology
17:12 D. Kondrakhova Use of advanced scanning probe spectroscopy techniques and physical techniques for analyzing dessicated tear fluid
17:30 L. Fojt AFM as a tool for visualization of biopolymer adsorption onto the carbon electrode surface
19:30 - 23:00 SOCIAL EVENING
Friday, 25 April
Metrology and applications I
9:00 J. Martinek Two probe SThM diffusivity
9:18 A. Charvátová Campbell Calibration of scanning thermal microscope using optimal estimation of function parameters by iterated linearization
9:36 M. Khytko Perovskite degradation study using AFM: insights into stability and surface morphology
9:54 S. Banerjee Light-induced degradation of MAPI perovskite thin films probed by AFM
10:12 I. Rangelow Active probe atomic force microscopy with quattro-parallel cantilever arrays for high-throughput large-scale sample IC inspection
10:30 D. Novotný / Bruker application scientist Měřicí technika Morava company presentation
10:50 COFFEE BREAK
Metrology and applications II
11:20 Š. Řeřucha Development of monolithic interferometric assembly for two-axis coordinate positioning with sub-nanometer precision
11:38 R. Šlesinger Gaussian processes prediction for directing measurement strategy in Gwyscope
11:56 D. Haško Influence of preparation conditions on the surface morphology of thin perovskite films
12:14 A. Mukherjee Graphite nanoparticles in amine plasma polymer film: AFM based study
12:32 V. Buršíková to be specified
12:50 LUNCH

Topics

  • Novel SPM modes and devices
  • UHV STM and AFM
  • SPM applications for different physical quantities
  • Instrumentation development and metrology
  • SPM data processing

List of invited speakers

  • Georg Fantner, École polytechnique fédérale de Lausanne, Switzerland
  • Teodor Gotszalk, Wroclaw University of Technology, Poland
  • Alice Pyne, University of Sheffield, United Kingdom
  • Martin Setvín, Charles University, Czech Republic
  • George Heath, University of Leeds, United Kingdom

The invited speakers list will be continually updated.

Sponsors and exhibitors

  • MT-M (main sponzor), representing Bruker, PREVAC and other companies
  • Nanosurf
  • Park Systems
  • Nicolet CZ, representing Neaspec
  • Uni-Export Instruments, representing Witec
  • NenoVision

List of exhibitors will be continually updated.

SPM workshop is also supported by project FW10010168 (IM BEAST), which has received funding from the Technology agency of the Czech Republic and Ministry of Industry and Trade of the Czech Republic as part of the TREND programme.

Accommodation

For accomodation we recommend Hotel Lednice. We expect participants to book and pay the accomodation by themselves. Please note that the capacity of the hotel is limited (first come, first serve).

Another accomodation possibilies in Lednice are listed on Lednice pages (in Czech only). Even if Lednice is a small town, there are plenty of possibilities within walking distance from the workshop venue.

Registration

Registration was opened! The deadline for registration is 28th February 2025.

Workshop fee is 160 Euro and covers all the costs except accomodation.

Registration is done via CMI's website. We would like to ask our czech colleagues to use the czech form for the registration which is available here.

Registration deadline was extended to 21st March 2025.

© CMI 2014

News

We invite you to our SPM workshop in Lednice.

We offer a PhD position combined with job offer within MSCA project SPM4.0 and together with BUT

Contact

Department of primary nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
petr.klapetek(at)cmi.gov.cz