SPM workshop 2019

The event has passed - thank you for attending

Download the abstracts here.

Programme

Registration: Wed, 12:00 – 13:00
Opening: Wed, 13:00 – 13:10

Wed 13:10 – 13:50 Fernando Araujo de Castro Towards 3D nanoscale imaging of complex thin films using scanning probe microscopy
Wed 13:50 – 14:30 Denis Vasyukov Introduction to Scanning Microwave Microscopy
Wed 14:30 – 14:50 Anna Charvátová Campbell Nanoindentor tip analysis by AFM
Wed 14:50 – 15:10 Dušan Novotný Měřicí technika Morava s.r.o. company presentation
Wed 15:10 – 15:30 Coffee break
Wed 15:30 – 15:50 Teodor Gotszalk Array of electromagnetically cantilevers for force-distance spectroscopy metrological investigations
Wed 15:50 – 16:10 Daniel Haško Measurement of the elastic properties of soft samples in fluids
Wed 16:10 – 16:30 Vilma Buršíková Characterisation of plasma-polymer organosilicon composite thin films deposited under dusty plasma conditions
Wed 16:30 – 16:50 Jiří Buršík Local mechanical properties of advanced thermoelectrics
Wed 16:50 – 17:10 Egor Ukraintsev Peak Force AFM study of a chiral helicene-based macrocycles assembly on HOPG
Wed 17:10 – 17:30 David Nečas Tip dilation artefacts & roughness measurement – parametric approach
Wed 17:30 – 17:50 Filip Jakeš RMI company presentation
Wed 18:00 – 19:00 Dinner


Thu 9:00 – 9:40 Volker Neu Probing magnetic textures on the nanoscale
Thu 9:40 – 10:00 Matěj Hývl Contact force in C-AFM
Thu 10:00 – 10:20 Jaroslav Kuliček Microscopic surface potential study for understanding ionic migration in perovskites
Thu 10:20 – 10:40 Dušan Novotný Měřicí technika Morava s.r.o. company presentation
Thu 10:40 – 11:00 Coffee break
Thu 11:00 – 11:40 Yannick De Wilde Near-field investigation of plasmonic materials and devices at infrared wavelengths
Thu 11:40 – 12:00 Petr Klapetek FDTD calculations of infrared SNOM probes
Thu 12:00 – 12:20 Jan Vávra Scattering-Type Scanning Near-field Optical Microscopy and Spectroscopy for Nanoscale Chemical Analysis - company presentation
Thu 12:30 – 14:50 Lunch & group photo
Thu 14:50 – 15:10 Radovan Vraník Mechanical response of helicene molecules on Ag(111) substrate to RF pulses
Thu 15:10 – 15:30 Mihai-George Mureșan AFM measurements of laser-induced damaged sites
Thu 15:30 – 15:50 Bohuslav Rezek Nano-analysis of composition and photovoltaic properties of nanodiamonds with polypyrrole
Thu 15:50 – 16:10 Łukasz Zarodkiewicz MSA System company presentation
Thu 16:10 – 16:30 Coffee break
Thu 16:30 – 16:50 Ivan Ošťádal Cleaning tungsten STM tips for UHV measurements
Thu 16:50 – 17:10 Pavel Kocan Electric field of an STM tip as a tool for probing stability of molecular layers
Thu 17:10 – 17:30 Jiří Doležal Metastability of a copper phthalocyanine molecule on a thin insulating NaCl layer
Thu 17:30 – 17:50 Taras Chutora On-surface synthesis of ethynylene bridged anthracene polymers
Thu 17:50 – 18:10 Benjamin Mallada Atomic-scale study of impact of Boron and Nitrogen dopants in graphene chemical reactivity by STM/AFM/KPFM and DFT calculations.
Thu 18:10 – 18:30 Zdeněk Nováček LiteScope™ AFM-in-SEM: New applications and tools for in-situ sample analysis - company presentation
Thu 19:00 – 23:00 Social evening


Fri 9:20 – 9:30 Lukáš Fojt Characterization of carbon-based electrodes using AFM and Raman spectroscopy techniques
Fri 9:30 – 9:50 Marek Havlíček Polymer spheres calibration for use in particle counters done by AFM
Fri 9:50 – 10:10 Jan Martinek SThM and infrared microscope calibration method
Fri 10:10 – 10:30 Jan Vaniš Characterization of ZnO nanorod heterostructures
Fri 10:30 – 10:50 Marek Černík alpha300Ri Inverted 3D Confocal Raman Microscopy - company presentation
Fri 10:50 – 11:10 Coffee break
Fri 11:10 – 11:30 Dušan Hemzal Noble metal nanoparticles as template for successful characterization of biomolecules
Fri 11:30 – 11:50 Jan Přibyl AFM based spectroscopy for nanomechanical mapping of living cells, biomolecules and biomaterials
Fri 11:50 – 12:10 Tomáš Finsterle Microscopic study change of adhesion after drug exposure on surface coating with diamond and gold nanoparticles
Fri 12:10 – 12:30 Dušan Novotný Měřicí technika Morava s.r.o. company presentation
Fri 12:30 End of the workshop, lunch

Topics

  • Novel SPM modes and devices
  • UHV STM and AFM
  • SPM applications for different physical quantities
  • Instrumentation development and metrology
  • SPM data processing

List of invited speakers

  • Fernando Araujo de Castro, National Physical Laboratory, United Kingdom
  • Volker Neu, IFW Dresden, Germany
  • Yannick De Wilde, ESPCI, France
  • Denis Vasyukov, METAS, Switzerland
  • Séverine GOMES, INSA Lyon, France

Sponsors and exhibitors

  • MT-M (main sponzor), representing Bruker, SPECS, JPK Instruments and other companies
  • NenoVision
  • Uni-Export Instruments, representing Witec
  • RMI (NT–MDT)
  • Nicolet CZ, representing Neaspec
  • MSA System
  • Schaefer Technologie GmbH

Accommodation

For accomodation we recommend Hotel Lednice. We expect participants to book and pay the accomodation by themselves. Please note that the capacity of the hotel is limited (first come, first serve).

Another accomodation possibilies in Lednice are listed on Lednice pages. Even if Lednice is a small town, there are plenty of possibilities within walking distance from the workshop venue.

Registration

Registration is closed.

Book of abstracts

Downloadable in PDF from http://nanometrologie.cz/sbornik_2019.pdf


(c) CMI 2014

News

2020-02-28 New FDTD solver version GSvit 1.9.4 was released.

2019-06-11 New FDTD solver version GSvit 1.9.3 was released.

2019-10-12 New FDTD solver version GSvit 1.9.2 was released.

Image of the month


SiOx nanocomposite film deposited in dusty plasma

Contact

Department of nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
pklapetek(at)cmi.cz