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Wednesday, 23 April |
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| 13:00 |
Registration |
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| 13:55 |
Welcome |
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SPM for electrical, magnetic and mechanical properties |
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| 14:00 |
M. Hývl |
Contact force in current-detecting atomic force microscopy |
| 14:18 |
J. Šoltýs |
MFM tip-controlled magnetization of magnetic nanostructures |
| 14:36 |
E. Arbelo |
Park Systems company presentation |
| 14:54 |
P. Klapetek |
Advanced measurement modes in Gwyscope controller |
| 15:12 |
D. Badura |
Scanning probe microscope with active piezoresistive cantilever for versatile surface metrology |
| 15:30 |
D. Novotný |
News from MT-M (Měřicí technika Morava company presentation) |
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| 15:50 |
COFFEE BREAK |
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Self-sensing cantilevers |
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| 16:20 |
T. Gotszalk |
Metrology with MEMS devices |
| 16:56 |
B. Pruchnik |
Higher eigenmode atuation of active piezoresistive cantilevers for surface nanometrology |
| 17:14 |
I. Rangelow |
Active probe atomic force microscopy with quattro-parallel cantilever arrays for high-throughput large-scale sample IC inspection |
| 17:32 |
W. Kopczyński |
Active piezoresistive cantilevers in nanorobotics |
| 17:50 |
J. Horák |
News from Bruker (Měřicí technika Morava company presentation) |
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| 18:15 |
DINNER |
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| 19:00 |
Exhibitors |
Experience the AFM: practical demonstration of instruments and free discussion with company representatives |
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Thursday, 24 April |
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Atomistic phenomena |
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| 9:00 |
M. Setvín |
Imaging and tracking polarons in Fe2O3 and SrTiO3 by atomic force microscopy |
| 9:36 |
P. Jelínek |
Observables in STM: can we see molecular orbitals? |
| 9:54 |
E. Ukraintsev |
AFM, FFMD simulations and CD analyses of [7]-helicene assembly on ZnO polar and non-polar facets. |
| 10:12 |
M. Rejhon |
Exploring ABC-stacked graphene domains in untwisted epitaxial graphene |
| 10:30 |
K. Šec |
Nanoscale optical and chemical characterization of nanomaterials using s-SNOM technology (Nicolet CZ company presentation) |
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| 10:50 |
COFFEE BREAK |
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Beyond standard measurements and analysis |
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| 11:20 |
G. Heath |
Localization atomic force microscopy |
| 11:56 |
B. Papulová |
Use of localized atomic force microscopy to improve imaging resolution |
| 12:14 |
P. Klok |
Nanoscale time-resolved photoluminescence mapping of CsPbBr3 nanocrystals via near-field optical microscopy |
| 12:32 |
M. Černík |
Correlative Raman-AFM (Uni-Export Instruments company presentation) |
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| 12:50 |
LUNCH |
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Advanced and correlative measurements |
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| 14:00 |
G. Fantner |
Scanning Ion Conductance Microscopy and Spectroscopy |
| 14:36 |
B. Hoogenboom |
Surface roughness analysis by atomic force microscopy (Nanosurf company presentation) |
| 14:54 |
O. Novotný |
Development of an in-situ methodology for the measurement of sensitive materials (Nenovision company presentation) |
| 15:12 |
J. Hruška |
Atomic force microscopy combined with scanning electron microscopy in life sciences |
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| 15:30 |
COFFEE BREAK |
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Bio-AFM |
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| 16:00 |
J. Přibyl |
Multiscale analysis of biological systems: integrating imaging, mechanical characterization, and chemical profiling |
| 16:18 |
J. Máčala |
Dual-organoid biosensor for monitoring cardiac conduction disturbances in vitro |
| 16:36 |
B. Brázdilová |
Standardization of methods for characterization of mechanical properties of soft samples at nanoscale |
| 16:54 |
R. Obořilová |
AFM spectroscopy for the study of lipid bilayer stability and morphology |
| 17:12 |
D. Kondrakhova |
Use of advanced scanning probe spectroscopy techniques and physical techniques for analyzing dessicated tear fluid |
| 17:30 |
L. Fojt |
AFM as a tool for visualization of biopolymer adsorption onto the carbon electrode surface |
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| 19:30 - 23:00 |
SOCIAL EVENING |
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Friday, 25 April |
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Metrology and applications I |
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| 9:00 |
J. Martinek |
Two probe SThM diffusivity |
| 9:18 |
A. Charvátová Campbell |
Calibration of scanning thermal microscope using optimal estimation of function parameters by iterated linearization |
| 9:36 |
M. Khytko |
Perovskite degradation study using AFM: insights into stability and surface morphology |
| 9:54 |
S. Banerjee |
Light-induced degradation of MAPI perovskite thin films probed by AFM |
| 10:12 |
A. Sierakowski |
Piezoresistive technology as universal tool for various self-sensing microstructures |
| 10:30 |
D. Novotný / Bruker application scientist |
Měřicí technika Morava company presentation |
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| 10:50 |
COFFEE BREAK |
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Metrology and applications II |
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| 11:20 |
Š. Řeřucha |
Development of monolithic interferometric assembly for two-axis coordinate positioning with sub-nanometer precision |
| 11:38 |
R. Šlesinger |
Gaussian processes prediction for directing measurement strategy in Gwyscope |
| 11:56 |
D. Haško |
Influence of preparation conditions on the surface morphology of thin perovskite films |
| 12:14 |
A. Mukherjee |
Graphite nanoparticles in amine plasma polymer film: AFM based study |
| 12:32 |
V. Buršíková |
to be specified |
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| 12:50 |
LUNCH |
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