SPM workshop 2019

We coridally invite you to the next bi-annual SPM workshop that will take place between 27th and 29th March 2019 at Hotel Lednice, just in front of the Unesco national heritage monument Lednice castle. Workshop is organized by Department of nanometrology and technical length, Czech Metrology Institute.

The main aim of the workshop is to give an opportunity to meet with all the colleagues working on SPM fields in Central European region, share results and discuss the novel research topics.


The workshop will consist of set of invited lectures (40 min) and participants oral presentations (20 min). A social evening programme is organized with financial support of the workshop sponsors. The workshop will start on Wednesday 27th March 2019 approximately at 1 p.m. and will finish on Friday 29th March around noon.

Registration: Wed, 12:00 – 13:00
Opening: Wed, 13:00 – 13:10

Wed 13:10 – 13:50 Fernando Araujo de Castro Towards 3D nanoscale imaging of complex thin films using scanning probe microscopy
Wed 13:50 – 14:30 Denis Vasyukov Introduction to Scanning Microwave Microscopy
Wed 14:30 – 14:50 Anna Charvátová Campbell Nanoindentor tip analysis by AFM
Wed 14:50 – 15:10 Dušan Novotný Měřicí technika Morava s.r.o. company presentation
Wed 15:10 – 15:30 Coffee break
Wed 15:30 – 15:50 Teodor Gotszalk Array of electromagnetically cantilevers for force-distance spectroscopy metrological investigations
Wed 15:50 – 16:10 Daniel Haško Measurement of the elastic properties of soft samples in fluids
Wed 16:10 – 16:30 Vilma Buršíková Characterisation of plasma-polymer organosilicon composite thin films deposited under dusty plasma conditions
Wed 16:30 – 16:50 Jiří Buršík Local mechanical properties of advanced thermoelectrics
Wed 16:50 – 17:10 Egor Ukraintsev Peak Force AFM study of a chiral helicene-based macrocycles assembly on HOPG
Wed 17:10 – 17:30 David Nečas Tip dilation artefacts & roughness measurement – parametric approach
Wed 17:30 – 17:50 Filip Jakeš RMI company presentation
Wed 18:00 – 19:00 Dinner

Thu 9:00 – 9:40 Volker Neu Probing magnetic textures on the nanoscale
Thu 9:40 – 10:00 Matěj Hývl Contact force in C-AFM
Thu 10:00 – 10:20 Jaroslav Kuliček Microscopic surface potential study for understanding ionic migration in perovskites
Thu 10:20 – 10:40 Dušan Novotný Měřicí technika Morava s.r.o. company presentation
Thu 10:40 – 11:00 Coffee break
Thu 11:00 – 11:40 Yannick De Wilde Near-field investigation of plasmonic materials and devices at infrared wavelengths
Thu 11:40 – 12:00 Petr Klapetek FDTD calculations of infrared SNOM probes
Thu 12:00 – 12:20 Jan Vávra Scattering-Type Scanning Near-field Optical Microscopy and Spectroscopy for Nanoscale Chemical Analysis - company presentation
Thu 12:30 – 14:50 Lunch & group photo
Thu 14:50 – 15:10 Radovan Vraník Mechanical response of helicene molecules on Ag(111) substrate to RF pulses
Thu 15:10 – 15:30 Mihai-George Mureșan AFM measurements of laser-induced damaged sites
Thu 15:30 – 15:50 Bohuslav Rezek Nano-analysis of composition and photovoltaic properties of nanodiamonds with polypyrrole
Thu 15:50 – 16:10 Łukasz Zarodkiewicz MSA System company presentation
Thu 16:10 – 16:30 Coffee break
Thu 16:30 – 16:50 Ivan Ošťádal Cleaning tungsten STM tips for UHV measurements
Thu 16:50 – 17:10 Pavel Kocan Electric field of an STM tip as a tool for probing stability of molecular layers
Thu 17:10 – 17:30 Jiří Doležal Metastability of a copper phthalocyanine molecule on a thin insulating NaCl layer
Thu 17:30 – 17:50 Taras Chutora On-surface synthesis of ethynylene bridged anthracene polymers
Thu 17:50 – 18:10 Benjamin Mallada Atomic-scale study of impact of Boron and Nitrogen dopants in graphene chemical reactivity by STM/AFM/KPFM and DFT calculations.
Thu 18:10 – 18:30 Zdeněk Nováček LiteScope™ AFM-in-SEM: New applications and tools for in-situ sample analysis - company presentation
Thu 19:00 – 23:00 Social evening

Fri 9:20 – 9:30 Lukáš Fojt Characterization of carbon-based electrodes using AFM and Raman spectroscopy techniques
Fri 9:30 – 9:50 Marek Havlíček Polymer spheres calibration for use in particle counters done by AFM
Fri 9:50 – 10:10 Jan Martinek SThM and infrared microscope calibration method
Fri 10:10 – 10:30 Jan Vaniš Characterization of ZnO nanorod heterostructures
Fri 10:30 – 10:50 Marek Černík alpha300Ri Inverted 3D Confocal Raman Microscopy - company presentation
Fri 10:50 – 11:10 Coffee break
Fri 11:10 – 11:30 Dušan Hemzal Noble metal nanoparticles as template for successful characterization of biomolecules
Fri 11:30 – 11:50 Jan Přibyl AFM based spectroscopy for nanomechanical mapping of living cells, biomolecules and biomaterials
Fri 11:50 – 12:10 Tomáš Finsterle Microscopic study change of adhesion after drug exposure on surface coating with diamond and gold nanoparticles
Fri 12:10 – 12:30 Dušan Novotný Měřicí technika Morava s.r.o. company presentation
Fri 12:30 End of the workshop, lunch


  • Novel SPM modes and devices
  • UHV STM and AFM
  • SPM applications for different physical quantities
  • Instrumentation development and metrology
  • SPM data processing

Preliminary list of invited speakers

  • Fernando Araujo de Castro, National Physical Laboratory, United Kingdom
  • Volker Neu, IFW Dresden, Germany
  • Yannick De Wilde, ESPCI, France
  • Denis Vasyukov, METAS, Switzerland
  • Séverine GOMES, INSA Lyon, France

The invited speakers list will be continually updated.

Sponsors and exhibitors

  • MT-M (main sponzor), representing Bruker, SPECS, JPK Instruments and other companies
  • NenoVision
  • Uni-Export Instruments, representing Witec
  • RMI (NT–MDT)
  • Nicolet CZ, representing Neaspec
  • MSA System
  • Schaefer Technologie GmbH

List of exhibitors will be continually updated.


For accomodation we recommend Hotel Lednice. We expect participants to book and pay the accomodation by themselves. Please note that the capacity of the hotel is limited (first come, first serve).

Another accomodation possibilies in Lednice are listed on Lednice pages. Even if Lednice is a small town, there are plenty of possibilities within walking distance from the workshop venue.


Registration deadline was extended to 4th March 2019.

Workshop fee is 80 Euro and covers all the costs except accomodation.

Registration is done via CMI's website. We would like to ask our czech colleagues to use the czech form for the registration which is avalilable here.

Book of abstracts

Downloadable in PDF from http://nanometrologie.cz/sbornik_2019.pdf

(c) CMI 2014


2019-06-11 New FDTD solver version GSvit 1.9.3 was released.

2019-10-12 New FDTD solver version GSvit 1.9.2 was released.

We invite you to our SPM workshop.

Image of the month

AFM scan of polystyrene (PSL) nanoparticles having 100 nm and 300 nm in diameter


Department of nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno