Books

P. Klapetek et al., Quantitative Data Processing in Scanning Probe Microscopy, Elsevier, 368 pages, ISBN: 9781455730582 (2012)

Book covers basics of instrumentation, data processing, artifacts and modeling in the fields of local dimensional, mechanical, electrical, magnetic, thermal and optical measurements using Scanning Probe Microscopy techniques (AFM, STM, EFM, MFM, SThM, SNOM, etc.).

Book chapters

  • P. Klapetek, Scanning Probe Microscopy Characterization of Optical Thin Films p. 315, 2018, in Optical Characterization of Optical Thin Films, Eds. Stenzel, Ohlídal, Springer 2018
  • P. Klapetek, I. Ohlídal, J. Bílek, Atomic force microscope tip influence on the fractal and multi-fractal analyses of the properties of randomly rough surfaces Nanoscale Calibration Standards and Methods, ed. by G. Wilkening and L Koenders, Wiley VCH, p. 452, 2005

    • Journal articles

    2025

  • Anna Charvátová Campbell, Petr Klapetek, Radek Šlesinger, Viktor Witkovský, Gejza Wimmer, Fitting the AFM force–distance curves the correct way, Meas. Sci. Technol. 36 (2025) 015022, DOI: https://doi.org/10.1088/1361-6501/ad8b60

    • 2024

  • Anna Charvátová Campbell, Zdeňka Geršlová, Vojtěch Šindlář, Radek Šlesinger, Gejza Wimmer, New framework for nanoindentation curve fitting and measurement uncertainty estimation, Prec. Eng. 85 (2024) 166-173, DOI: https://doi.org/10.1016/j.precisioneng.2023.10.001
  • Ivan Ohlídal, Jiří Vohánka, Jan Dvořák, Vilma Buršíková, Petr Klapetek, Determination of Optical and Structural Parameters of Thin Films with Differently Rough Boundaries, Coatings 14 (2024) 1439, https://doi.org/10.3390/coatings14111439
  • Petr Klapetek, David Nečas, Edward Heaps, Bruno Sauvet, Vojtěch Klapetek, Miroslav Valtr, Virpi Korpelainen, Andrew Yacoot, Stitching accuracy in large area scanning probe microscopy, Meas. Sci. Technol. 35 (2024) 125026, DOI: https://doi.org/10.1088/1361-6501/ad7a13
  • Xizhi Sun, Edward Heaps, Andrew Yacoot, Qingping Yang, Petr Grolich, Petr Klapetek, Three-dimensional drift correction of localised non-raster scanning on atomic force microscopy, Meas. Sci. Technol. 35 (2024) 117003, DOI: https://doi.org/10.1088/1361-6501/ad667d
  • Eleonora Cara, Philipp Hönicke, Yves Kayser, Burkhard Beckhoff, Andrea M. Giovannozzi, Petr Klapetek, Alberto Zoccante, Maurizio Cossi, Li-Lin Tay, Luca Boarino, Federico Ferrarese Lupi, Molecular surface coverage standards by reference-free GIXRF supporting SERS and SEIRA substrate benchmarking, Nanophotonics (2024), DOI: https://doi.org/10.1515/nanoph-2024-0222
  • Alberto Zoccante, Eleonora Cara, Federico Ferrarese Lupi, Philipp Hönicke, Yves Kayser, Burkhard Beckhoff, Petr Klapetek, Davide Marchia, Maurizio Cossi, The thermodynamics of self-assembled monolayer formation: a computational and experimental study of thiols on a flat gold surface, Phys. Chem. Chem. Phys. 26 (2024) 18799-18807, DOI: https://doi.org/10.1039/D4CP01322K
  • Jana Grundmann, Bernd Bodermann, Elena Ermilova, Matthias Weise, Andreas Hertwig, Petr Klapetek, Jila Rafighdoost, Silvania F. Pereira, Optical and tactile measurements on SiC sample defects, J. Sens. Sens. Syst. 13 (2024) 109–121, DOI: https://doi.org/10.5194/jsss-13-109-2024

    • 2023

  • Štěpánka Kelarová, Roman Přibyl, Vojtěch Homola, Josef Polčák, Anna Charvátová Campbell, Marek Havlíček, Kateřina Vrchovecká, Richard Václavik, Lukáš Zábranský, Vilma Buršíková, Influence of the argon ratio on the structure and properties of thin films prepared using PECVD in TMSAc/Ar mixtures, Vacuum 207 (2023) 111634, DOI: https://doi.org/10.1016/j.vacuum.2022.111634
  • Václav Šulc, Jiří Vohánka, Ivan Ohlídal, Petr Klapetek, Miloslav Ohlídal, Nupinder Jeet Kaur, František Vižďa, Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory, Coatings 13 (2023) 1853, DOI: https://doi.org/10.3390/coatings13111853
  • Ivan De Carlo, Luisa Baudino, Petr Klapetek, Mara Serrapede, Fabio Michieletti, Natascia De Leo, Fabrizio Pirri, Luca Boarino, Andrea Lamberti, Gianluca Milano, Electrical and Thermal Conductivities of Single CuxO Nanowires, Nanomaterials 13 (2023) 2822, DOI: https://doi.org/10.3390/nano13212822
  • Elisa Maddalena Sala, Petr Klenovský, Anomalous luminescence temperature dependence of (In,Ga)(As,Sb)/GaAs/GaP quantum dots overgrown by a thin GaSb capping layer for nanomemory applications, New J. Phys. 25 (2023) 113012, DOI: https://doi.org/10.1088/1367-2630/ad0856
  • Miroslav Valtr, Petr Klapetek, Jan Martinek, Ondřej Novotný, Zdeněk Jelínek, Václav Hortvík, David Nečas, Scanning Probe Microscopy controller with advanced sampling support, HardwareX 15 (2023) e00451, DOI: https://doi.org/10.1016/j.ohx.2023.e00451
  • Xueyong Yuan, Saimon F. Covre da Silva, Diana Csontosová, Huiying Huang, Christian Schimpf, Marcus Reindl, Junpeng Lu, Zhenhua Ni, Armando Rastelli, Petr Klenovský, GaAs quantum dots under quasiuniaxial stress: Experiment and theory, Phys. Rev. B 107, 235412 (2023), DOI: https://doi.org/10.1103/PhysRevB.107.235412
  • Jiří Vohánka, Václav Šulc, Ivan Ohlídal, Miloslav Ohlídal, Petr Klapetek, Optical method for determining the power spectral density function of randomly rough surfaces by simultaneous processing of spectroscopic reflectometry, variable-angle spectroscopic ellipsometry and angle-resolved scattering data, Optik - International Journal for Light and Electron Optics 280 (2023) 170775, DOI: https://doi.org/10.1016/j.ijleo.2023.170775
  • D. Nečas, A. Yacoot, M. Valtr, P. Klapetek, Demystifying data evaluation in the measurement of periodic structures, Meas. Sci. Technol. 34 (2023) 055015 (21pp), DOI: https://doi.org/10.1088/1361-6501/acbab3
  • Daniel Franta, Jiří Vohánka, Jan Dvořák, Pavel Franta, Ivan Ohlídal, Petr Klapetek, Jaromír Březina, David Škoda, Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model, Coatings 13 (2023) 218, DOI: https://doi.org/10.3390/coatings13020218

    • 2022

  • R. Puttock, C. Barton, E. Saugar, P. Klapetek, A. Fernández-Scarioni, P. Freitas, H. W. Schumacher, T. Ostler, O. Chubykalo-Fesenko, O. Kazakova Local thermoelectric response from a single Néel domain wall Science Advances, 8 (47) 2022, DOI: 10.1126/sciadv.adc9798
  • I. Ohlídal, J. Vohánka, V. Buršíková, J. Dvořák, P. Klapetek, and N. Jeet Kaur Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies Optics Express 30 (21), pp.39068-39085 2022
  • D. Marchi, E. Cara, F. Ferrarese Lupi, Ph. Hönicke, Y. Kayser, B. Beckhof M.Castellino, P. Klapetek, A. Zoccante, M. Lausa, M. Cossi Structure and stability of 7-mercapto-4-methylcoumarin self-assembled monolayers on gold: an experimental and computational analysis Physical Chemistry Chemical Physics 24 (36) , pp.22083-22090 2022
  • P. Klenovský, J. Valdhans, L. Krejčí, M. Valtr, P. Klapetek, O. Fedotova, Interplay between multipole expansion of exchange interaction and Coulomb correlation of exciton in colloidal II–VI quantum dots, Electron. Struct. 4 (2022) 015006, DOI: https://doi.org/10.1088/2516-1075/ac5b7e
  • T. Käseberg, J. Grundmann, T. Siefke, P. Klapetek, M. Valtr, S. Kroker and B. Bodermann, Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures, Front. Phys. 9 (2022) 814559, DOI: https://doi.org/10.3389/fphy.2021.814559
  • Jiří Vohánka, Ivan Ohlídal, Vilma Buršíková, Petr Klapetek, and Nupinder Jeet Kaur Optical characterization of inhomogeneous thin films with randomly rough boundaries Optics Express, 30 (2) , pp.2033-2047, 2022

    • 2021

  • Š. Kelarová, M. Stupavská, V. Homola, R. Přibyl, L. Zábranský, A. Charvátová Campbell, M. Havlíček, R. Václavik, V. Buršíková, Stability of trimethylsilyl acetate-based plasma polymers towards atmospheric and water environments, Polym. Degrad. Stab. 190 (2021) 109628, DOI: https://doi.org/10.1016/j.polymdegradstab.2021.109628
  • J. Nohava, J. Čech, M. Havlíček, R. Consiglio, Indenter wear study and proposal of a simple method for evaluation of indenter blunting, J. Mater. Res. 36 (2021) 4449–4459, DOI: https://doi.org/10.1557/s43578-021-00401-4
  • Š. Šustek, J. Vohánka, I. Ohlídal, M. Ohlídal, V. Šulc, P. Klapetek, N. J. Kaur, Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy, J. Opt. 23 (2021) 105602, DOI: https://doi.org/10.1088/2040-8986/ac1f35
  • E. Guen,P. O. Chapuis, N. J. Kaur, P. Klapetek, S. Gomés, Impact of roughness on heat conduction involving nanocontacts, Appl. Phys. Lett. 119 (2021) 161602, DOI: https://doi.org/10.1063/5.0064244
  • X. Sun, E. Heaps, A. Yacoot, Q. Yang, P. Grolich, P. Klapetek, Three-dimensional drift correction of scan data from atomic force microscopy using Lissajous scanning paths, Meas. Sci. Technol. 32 (2021) 115010, DOI: https://doi.org/10.1088/1361-6501/ac100f
  • D. Nečas, P. Klapetek, Synthetic Data in Quantitative Scanning Probe Microscopy, Nanomaterials 11 (2021) 1746, DOI: https://doi.org/10.3390/nano11071746
  • P. Klapetek, P. Grolich, D. Nezval, M. Valtr, R. Šlesinger, D. Nečas, GSvit — An open source FDTD solver for realistic nanoscale optics simulations, Computer Physics Communications 265 (2021) 108025, DOI: https://doi.org/10.1016/j.cpc.2021.108025

    • 2020

  • J. Garnaes, D. Nečas, L. Nielsen, M. H. Madsen, A. T. Rosell, G. Zeng, P. Klapetek, A. Yacoot, Algorithms for using silicon steps for scanning probe microscope evaluation, Metrologia 57 (2020) 064002, DOI: https://doi.org/10.1088/1681-7575/ab9ad3
  • D. Nečas, M. Valtr, P. Klapetek, How levelling and scan line corrections ruin roughness measurement and how to prevent it, Scientific Reports 10 (2020) 15294, DOI: https://doi.org/10.1038/s41598-020-72171-8
  • P. Klapetek, A. Yacoot, V. Hortvík, V. Duchoň, H. Dongmo, A. Řeřucha, M. Valtr, D. Nečas, Multiple fibre interferometry setup for probe sample interaction measurements in atomic force microscopy, Meas. Sci. Technol. 31 (2020) 094001, DOI: https://doi.org/10.1088/1361-6501/ab85d8
  • E. Guen, P. Klapetek, R. Puttock, B. Hay, A. Allard, T. Maxwell, P.-O. Chapuis, D. Renahy, G. Davee, M. Valtr, J. Martinek, O. Kazakova, S Gomes, SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis, Int. J. of Thermal Sciences 156 (2020) 106502
  • D. Nečas, P. Klapetek, M. Valtr, Estimation of roughness measurement bias originating from background subtraction, Measurement Science and Technology 31 (2020) 094010, DOI: https://doi.org/10.1088/1361-6501/ab8993
  • E. Heaps, A. Yacoot, H. Dongmo, L. Picco, O. D. Payton, F. Russel Pavier, P. Klapetek, Bringing real-time traceability to high-speed atomic force microscopy, Meas. Sci. Technol, 7 (2020) 074005
  • H. Corte‐León, V. Neu, A. Manzin, C. Barton, Y. Tang, M. Gerken, P. Klapetek, H. W. Schumacher, O. Kazakova, Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes, Small (2020) 1906144
  • X. Hu, G. Dai, S. Sievers, A. Fernández-Scarioni, H. Corte-León, R. Puttock, C. Barton, O. Kazakova, M. Ulvr, P. Klapetek, M. Havlíček, D. Nečas, Y. Tange, V. Neu, H. W. Schumacher, Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy, Journal of Magnetism and Magnetic Materials 511 (2020) 166947 DOI: https://doi.org/10.1016/j.jmmm.2020.166947

    • 2019

  • A. Charvátová Campbell, V. Buršíková, J. Martinek, P. Klapetek, Modeling the influence of roughness on nanoindentation data using finite element analysis International Journal of Mechanical Sciences 161 (2019) 105015
  • P. Klapetek, A. Charvátová Campbell, V. Buršíková, Fast mechanical model for probe-sample elastic deformation estimation in scanning probe microscopy. Ultramicroscopy (2019), 201:18-27. Doi: https://doi.org/10.1016/j.ultramic.2019.03.010
  • D. Nečas, P. Klapetek, V. Neu, M. Havlíček, R. Puttock, O. Kazakova, X. Hu, L. Zajíčková, Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method, Scientific Reports 9 (2019) 3880
  • J. Martinek, M. Valtr, V. Hortvík, P. Grolich, D. Briand, M. Shaker, Petr Klapetek, Large area scanning thermal microscopy and infrared imaging system, Measurement Science and Technology 30 (2019) 035010
  • A. Yacoot, P. Klapetek, M. Valtr, P. Grolich, H. Dongmo, G. M Lazzerini, Angus Bridges, Design and performance of a test rig for evaluation of nanopositioning stages Measurement Science and Technology 30 (2019) 035002
  • B. Čechalová, M. Branecký, P. Klapetek, V. Čech, Optical Properties of Oxidized Plasma-Polymerized Organosilicones and Their Correlation with Mechanical and Chemical Parameters Materials 12 (2019) 539
  • A. Charvátová Campbell, P. Grolich, R. Šlesinger, Niget: Nanoindentation general evaluation tool, SoftwareX 9 (2019) 248-254. DOI: https://doi.org/10.1016/j.softx.2019.03.001

    • 2017

  • P. Klapetek, J. Martinek, P. Grolich, M. Valtr, N. J. Kaur, Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy, International Journal of Heat and Mass Transfer 108 (2017) 841–850
  • P. Klenovsky, J. Zuda, P. Klapetek, J. Humlicek, Ellipsometry of surface layers on a 1-kg sphere from natural silicon. Applied Surf. Sci. 421 (2017) 542 - 546

    • 2016

  • P. Stadler, D. Farka, H. Coskun, E. D. Glowacki, C. Yumusak, L. M. Uiberlacker, S. Hild, L. N. Leonat, M. C. Scharber, P. Klapetek, R. Menon, N. S. Sariciftci, Local order drives the metallic state in PEDOT:PSS, Journal of Material Chemistry C 4 (2016) 6982-6987
  • A. Sikora, A. Rodak, O. Unold, P. Klapetek, The development of the spatially correlated adjustment wavelet filter for atomic force microscopy data, Ultramicroscopy 171 (2016) 146-152
  • A. C. Campbell, P. Jelínek, P. Klapetek, Study of uncertainties of height measurements of monoatomic steps on Si 5 × 5 using DFT, Meas. Sci. Technol. 28 (2016) 034005
  • D. Nečas, P. Klapetek, Study of user influence in routine SPM data processing, Meas. Sci. Technol. 28 (2016) 034014
  • P. Klapetek, A. Yacoot, P. Grolich, M. Valtr, D. Nečas, Gwyscan: a library to support non-equidistant scanning probe microscope measurements, Meas. Sci. Technol. 28 (2016) 034015

    • 2015

  • P. Klapetek, M. Valtr, L. Picco, O. D. Payton, J. Martinek, A. Yacoot, M. Miles, Large area high-speed metrology SPM system, Nanotechnology 26 (2015)
  • A. Fejfar, M. Hývl, A. Vetushka, P. Pikna, Z. Hájková, M. Ledinský, J. Kočka, P. Klapetek, A. Marek, A. Mašková, J. Vyskočil, J. Merkel, C. Becker, T. Itoh, S. Misra, M. Foldyna, LW. Yu, P. R. I Cabarrocas, Correlative microscopy of radial junction nanowire solar cells using nanoindent position markers, Solar Energy Materials and Solar Cells 135 (2015) 106-112
  • J. Martinek, P. Klapetek, A. C. Campbell, Methods for topography artifacts compensation in scanning thermal microscopy, Ultramicroscopy 155 (2015) 55-61

    • 2014

  • J. Lazar, P. Klapetek, M. Valtr, J. Hrabina, Z. Buchta, O. Číp, M. Čížek, J. Oulehla, M. Šerý, Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy, Sensors 14 (2014) 877-886
  • J. Man, A. Weidner, P. Klapetek, J. Polák, Slip activity of persistent slip bands in early stages of fatigue life of austenitic 316L steel, Materials Structure & Micromechanics of Fracture VII 592-593 (2014) 785-788
  • J. Hrabina, J. Lazar, P. Klapetek, M. Valtr, O. Číp, J. Oulehla, M. Čížek, M. Holá, M. Šerý, 6-axis interferometric coordinates measurement system for nanometrology, Photonic Instrumentation Engineering 8992 (2014)
  • J. Hrabina, J. Lazar, P. Klapetek, O. Číp, M. Čížek, M. Holá, M. Šerý, Interferometric coordinates measurement system for local probe microscopy nanometrology, Nanocon 2013, 5th International Conference (2014) 797-802
  • J. Martinek, M. Valtr, R. Cimrman, P. Klapetek, Thermal conductivity analysis of delaminated thin films by scanning thermal microscopy, Measurement Science and Technology 25 (2014)
  • P. Klapetek, D. Nečas, Independent analysis of mechanical data from atomic force microscopy, Measurement Science and Technology 25 (2014)
  • A. Rae, R. Stosch, P. Klapetek, A.R.H. Walker, D. Roy, State of the art Raman techniques for biological applications, Methods 68 (2014) 338-347
  • D. Nečas, V. Čudek, J. Vodák, M. Ohlídal, P. Klapetek, J. Benedikt, K. Ruegner, L. Zajíčková, Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry, Meas. Sci. Technol. 25 (2014)

    • 2013

  • D. Nečas, P. Klapetek, One-dimensional autocorrelation and power spectrum density functions of irregular regions, Ultramicroscopy 124 (2013) 13-19
  • J. Hrabina, J. Lazar, P. Klapetek, O. Číp, M. Čížek, M. Šerý, Nanometrology interferometric coordinates measurement system for local probe microscopy, Sixth International Symposium on Precision Mechanical Measurements 8916 (2013)
  • P. Klapetek, L. Picco, O. Payton, A. Yacoot, M. Miles, Error mapping of high-speed AFM systems, Meas. Sci. Technol. 24 (2013)

    • 2012

  • P. Klapetek, M. Valtr, V. Duchoň and J. Sobota, Voice coil-based scanning probe microscopy, Nanoscale Research Letters 7 (2012) 332
  • P. Klapetek, M. Valtr, P. Buršík, Non-equidistant scanning approach for millimetre-sized SPM measurements, Nanoscale Research Letters 7 (2012) 213
  • D. Nečas, P. Klapetek, Gwyddion: an open-source software for SPM data analysis, Central European Journal of Physics, 10 (2012) 181-188
  • J. Lazar, J. Hrabina, M. Šerý, P. Klapetek, O. Číp, Multiaxis interferometric displacement measurement for local probe microscopy, Central European Journal of Physics, 10 (2012) 225-231
  • L. Fojt, P. Klapetek, L Strašák, V. Vetterl, Fibrinogen and cellular adherability on differently treated titanium as implants, Central European Journal of Physics, 10 (2012) 232-238

    • 2011

  • P. Klapetek, L. Koenders, Nanoscale metrology, Meas. Sci. Technol 22 (2011) 090101
  • U. Brand, E. Beckert, A. Beutler, GL. Dai, C. Stelzer, A. Hertwig, P. Klapetek, J. Koglin, R. Thelen, R. Tutsch, Comparison of optical and tactile layer thickness measurements of polymers and metals on silicon or SiO2, Meas. Sci. Technol 22 (2011) 094021
  • A. Campbellová, M. Valtr, J. Zůda, P. Klapetek, Traceable measurements of small forces and local mechanical properties, Meas. Sci. Technol 22 (2011)
  • P. Klapetek, M. Valtr, M. Matula, A long-range scanning probe microscope for automotive reflector optical quality inspection, Meas. Sci. Technol 22 (2011) 094011
  • J. Hrabina, J. Lazar, P. Klapetek, O. Číp, Multidimensional interferometric tool for the local probe microscopy nanometrology, Meas. Sci. Technol 22 (2011) 094030
  • P. Klapetek, M. Valtr, D. Nečas, O. Salýk, P. Dzik, Atomic force microscopy analysis of nanoparticles in non-ideal conditions, Nanoscale Research Letters 6 (2011) 514
  • M. Ohlídal, I. Ohlídal, P. Klapetek, D. Nečas, A. Majumdar, Measurement of the thickness distribution and optical constants of non-uniform thin films, Meas. Sci. Technol. 22 (2011) 085104
  • A. Campbellová, M. Ondráček, P. Pou, R. Pérez, P. Klapetek, P. Jelínek, 'Sub-atomic' resolution of non-contact atomic force microscope images induced by a heterogeneous tip structure: a density functional theory study Nanotechnology 22 (2011) 295710
  • A. Campbellová, P. Klapetek, M. Valtr, Uncertainty modeling in nanoscale scanning probe microscopy measurements of fullerene C-60, Meas. Sci. Technol. 22 (2011) 035106
  • P. Klapetek, D. Nečas, A. Campbellová, A. Yacoot, L. Koenders, Methods for determining and processing 3D errors and uncertainties for AFM data analysis, Meas. Sci. Technol. 22 (2011) 025501
  • V. Buršíková, O. Bláhová, M. Karásková, L. Zajíčková, O. Jašek, D. Franta, P. Klapetek, J. Buršík, Mechanical properties of ultrananocrystalline thin films deposited using dual frequency discharges, Chemicke listy 105 (2011) S98-S101

    • 2010

  • P. Klapetek, M. Valtr, A. Poruba, D. Nečas, M. Ohlídal, Rough surface scattering simulations using graphics cards, Appl. Surf. Sci. 256 (2010) 5640-5643
  • P. Klapetek, J. Bujdák, J. Buršík, Near-field scanning optical microscopy local luminescence studies of rhodamine dye, Central European Journal of Physics, 8 (2010) 312-317
  • A. Campbellová, P. Klapetek, V. Buršíková, M. Valtr, J. Buršík, Small-load nanoindentation experiments on metals, Surface and Interface Analysis 6-7 (2010) 766-769
  • P. Klapetek, M. Valtr, Near-field optical microscopy simulations using graphics processing units, Surface and Interface Analysis 6-7 (2010) 1109-1113
  • H. U. Danzebrink, L. Koenders, G. B. Picotto, A. Lasilla, S.H.H. Wang, P. Klapetek, Final report on EUROMET.L-S15.a (EUROMET Project 925): Intercomparison on step height standards and 1D gratings, Metrologia 47 (2010) DOI: https://doi.org/10.1088/0026-1394/47/1A/04006

    • 2009

  • Miloslav Ohlídal, Ivan Ohlídal, Petr Klapetek, David Nečas, Vilma Buršíková, Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films, Diamond and Related Materials, Volume 18, Issues 2-3, February-March 2009, Pages 384-387
  • J. Lazar, P. Klapetek, O. Číp, M. Čížek, M. Šerý, Local probe microscopy with interferometric monitoring of the stage nanopositioning, Meas. Sci. Technol., 20, 084007
  • A. Campbellová, P. Klapetek, M. Valtr, Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements, Meas. Sci. Technol. 20 084014
  • Lukáš Fojt, Petr Klapetek, Luděk Strašák, Vladimír Vetterl, 50 Hz magnetic field effect on the morphology of bacteria, Micron, Volume 40, Issue 8, December 2009
  • J. Man, P. Klapetek, O. Man, A. Weidner, K. Obrtlík, J. Polák, Extrusions and intrusions in fatigued metals. Part 2. AFM and EBSD study of the early growth of extrusions and intrusions in 316L steel fatigued at room temperature Philosophical Magazine, Volume 89, 16, 2009, 1337 - 1372

    • 2008

  • J. Orava, T. Wagner, M. Krbal, T. Kohoutek, Mil. Vlcek, P. Klapetek and M. Frumar, Selective dissolution of Agx(As0.33S0.67?ySey)100?x chalcogenide thin films, Journal of Non-Crystalline Solids, Volume 354, Issues 2-9, 15 January 2008, Pages 533-539
  • J. Zemek, K. Olejnik, P. Klapetek, Photoelectron spectroscopy from randomly corrugated surfaces, Surface Science, Volume 602, Issue 7, 1 April 2008, Pages 1440-1446
  • Petr Klapetek, Jiří Buršík,Near-field scanning optical microscopy studies of thin film surfaces and interfaces, Applied Surface Science, Volume 254, Issue 12, 15 April 2008, Pages 3681-3684
  • Petr Klapetek, Jiří Buršík, Miroslav Valtr, Jan Martinek, Near-field scanning optical microscope probe analysis, Ultramicroscopy, Volume 108, Issue 7, June 2008, Pages 671-676
  • Daniel Franta, Lenka Zajíčková, Monika Karásková, Ondřej Jašek, David Nečas, Petr Klapetek, Miroslav Valtr, Optical characterization of ultrananocrystalline diamond films, Diamond and Related Materials, Volume 17, Issues 7-10, July-October 2008, Pages 1278-1282
  • A. Weidner, J. Man, W. Tirschler, P. Klapetek, C. Blochwitz, J. Polák, W. Skrotzki,Half-cycle slip activity of persistent slip bands at different stages of fatigue life of polycrystalline nickel, Materials Science and Engineering: A, Volume 492, Issues 1-2, 25 September 2008, Pages 118-127

    • 2007

  • D. Franta, I. Ohlídal, P. Klapetek, R. Nepustilová, S. Bajer, Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy, Surface and Interface Analysis, USA : John Wiley & Sons, 38, 4, od s. 842-846
  • L. Zajíčková, Z. Kučerová, D. Franta, V. Buršíková, J. Buršík, P. Sťahel, P. Klapetek, Plasma enhanced CVD of thin films using hexamethyldisiloxane and octamethyltetrasiloxane monomers, In 18th International Symposium on Plasma Chemistry. Kyoto : International Plasma Chemistry Society, 2007. s. 459-459
  • V. Buršíková, P. Dvořák, L. Zajíčková, D. Franta, J. Janča, J. Buršík, J. Sobota, P. Klapetek, V. Peřina, Deposition and Characterization of Nanostructured Silicon-Oxide Containing Diamond-Like Carbon Coatings, Optoelectronics and Advanced Materials - Rapid Communications, Bucharest : INOE & INFM, 1, 10, od s. 491-495, 5 s. 2007
  • J. Dušek, V. Buršíková, V. Navrátil, J. Buršík, O. Bláhová, P. Klapetek, Comparative study on several micro and nanoindentation techniques including AFM NANO ´06. Brno : University of Technology, Faculty of Mechanical Engineering and COMTES FHT, Ltd., Plzeň, 2007. od s. 30-30, 1 s. ISBN 80-214-3331-0.
  • P. Klapetek, J. Buršík, Artefakty v rastrovací optické mikroskopii v blízkém poli, Jemná mechanika a optika, 10 (2007), 279
  • P. Klapetek, I. Ohlídal, J. Buršík, Atomic force microscopy studies of cross-sections of columnar thin films, Meas. Sci. Technol. 18, 2 (2007)
  • M. Valtr, P. Klapetek, I. Ohlídal, D. Franta, UV light enhanced oxidation of a-C:H thin film in air. A study of thickness reduction, Optoelectronics and Advanced Materials - Rapid Communications Vol. 1, No. 11, November 2007, p. 620 - 624
  • M. Valtr, P. Klapetek, I. Ohlídal, V. Duchoň, Study of thickness reduction of a-C:H thin film under UV light irradiation, 28th ICPIG, July 15-20, 2007, Prague, Czech Republic
  • Petr Klapetek and Jiří Buršík, Near-field scanning optical microscopy studies of thin film surfaces and interfaces, Applied Surface Science, In Press, Corrected Proof, Available online 9 November 2007
  • Petr Klapetek, Jiří Buršík, Miroslav Valtr and Jan Martinek, Near-field scanning optical microscope probe analysis, Ultramicroscopy, In Press, Uncorrected Proof, Available online 12 November 2007
  • Petr Klapetek, Tomáš Wágner and Jiří Orava, Electromagnetic field distribution modelling in microlenses fabrication process, Journal of Physics and Chemistry of Solids, Volume 68, Issues 5-6, May-June 2007, Pages 887-890
  • J. Orava, T. Wágner, M. Krbal, T. Kohoutek, M. Vlček, L. Beneš, E. Kotulanová, P. Bezdička, P. Klapetek and M. Frumar, Selective wet-etching of amorphous/crystallized Ag-As-S and Ag-As-S-Se chalcogenide thin films, Journal of Physics and Chemistry of Solids, Volume 68, Issues 5-6, May-June 2007, Pages 1008-1013

    • 2006

  • V. Buršíková, L. Zajíčková, D. Franta, J. Janča, J. Buršík, P. Klapetek, O. Bláhová, V. Peřina, V. Navrátil, Deposition and Characterisation of Nanostructured silicon-oxide Containing Diamond-like Carbon Coatings. In 7th International Balkan Workshop on Applied Physics - Abstracts. 1. vyd. Constanta, Romania : Ovidius University, 2006. od s. 101-102, 1 s. ISBN 973-614-313-7
  • P. Klapetek, I. Ohlídal, J. Buršík, Applications of scanning thermal microscopy in the analysis of the geometry of patterned structures Surface and Interface Analysis, 38 (2006) 383

    • 2005

  • Petr Klapetek, Ivan Ohlídal, Jindřich Bílek, Atomic force microscope tip influence on the fractal and multi-fractal analyses of the properties of randomly rough surfaces Nanoscale Calibration Standards and Methods, ed. by G. Wilkening and L Koenders, Wiley VCH, p. 452, 2005
  • Petr Klapetek, Ivan Ohlídal, A. Montaigne Ramil, A. Bonnanni and H. Sitter, Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD Vacuum, 2005, Volume 80
  • Vilma Buršíková, Petr Klapetek, Angelique Bousquet, Marek Eliáš, Study of the mechanical properties of thin films using combined nanoindentation and AFM measurements Jemná mechanika a optika, 11_12, 323-326, 2005
  • Miroslav Valtr, Ivan Ohlídal, Petr Klapetek, AFM Study of Hydrocarbon Thin Films In WDS'05 Proceedings of Contributed Papers - Part II - Physics of Plasmas and Ionized Media (ed. J. Safrankova). Praha - Matfyzpress, 2005. 391-396
  • Ivan Ohlídal, Miloslav Ohlídal, Daniel Miloslav, Vlastimil Čudek, Vilma Buršíková, Petr Klapetek, Kateřina Páleníčková, Influence of technological conditions on mechanical stresses inside diamond-like carbon films Diamond and Related Materials, 14, 11-12, 1835-1838, 2005
  • Ohlídal I., Ohlídal M., Franta D., Čudek V., Buršíková V., Klapetek P., Jákl M.., Optical measurement of mechanical stresses in diamond-like carbon films Proceedings of 8-th International Symposium on Laser Metrology, SPIE 5776, 2005, 717-728
  • P. Klapetek, I. Ohlídal, Application of the wavelet transformation in AFM data analysis Acta Physica Slovaca, 55 (2005) 295
  • I. Ohlídal, D. Franta, P. Klapetek, Combination of optical methods and atomic force microscopy at characterization of thin film systems Acta Physica Slovaca, 55 (2005) 271
  • P. Klapetek, I. Ohlídal, J. Buršík, Scanning thermal microscopy - theory and applications Jemná mechanika a optika, 11-12 (2005) 327
  • R. Antoš, I. Ohlídal, D. Franta, P. Klapetek, J. Mistík, T. Yamaguchi, S. Višňovský, Spectroscopic ellipsometry of sinusoidal surface-relief gratings Applied Surface Science, 244 (2005) 221

    • 2004

  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter, Optical properties of ZnTe films prepared by molecular beam epitaxy Thin Solid Films, 468, 1-2, 193-202, 2004
  • Petr Klapetek, Ivan Ohlídal, Jindřich Bílek, Influence of the atomic force microscope tip on the multifractal analysis ofrough surfaces Ultramicroscopy, 102, 1, 51-59, 2004
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Miloslav Ohlídal, Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy Surface and Interface Analysis, 36, 8, 1203-1206, 2004
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Pere Roca i Cabarrocas, Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry Thin Solid Films, 455-456, 1, 399-403, 2004
  • Petr Klapetek, Ivan Ohlídal, Karel Navrátil, Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation Microchimica Acta, 147, 3, 175-180, 2004

    • 2003

  • Ivan Ohlídal, Petr Klapetek, Daniel Franta: Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe, Československý časopis pro fyziku, 2 (97-100), Praha, 2003.
  • Petr Klapetek, Ivan Ohlídal, Daniel Franta, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Atomic force microscopy characterization of ZnTe epitaxial films, Acta Physica Slovaca, 3 (223-230), Bratislava, 2003.
  • Petr Klapetek, Ivan Ohlídal, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Atomic force microscopy characterization of ZnTe epitaxial thin films, Japanese Journal of Applied Physics, 42 (4706-4709), Tokyo, 2003.
  • Zdeněk Frgala, Vít Kudrle, Jan Janča, Vilma Buršíková, Petr Vašina, Marcel Meško, Jiří Buršík, M. Kadlečíková, Petr Klapetek: Diamond Growth on silicon and WC-Co by microwave plasma chemical vapor deposition, Proceedings of contributed papers WDS'03, (341-346), Praha, 2003.
  • Vilma Buršíková, Pavel Dvořák, Lenka Zajíčková, Petr Klapetek, Jiří Buršík, Jan Janča: Effect of the Discharge Conditions on the Mechanical Properties of the Plasma Deposited DLC:SiOx Films, Proceedings of SAPP XIV., (197-198), Bratislava, 2003.
  • Martin Šiler, Ivan Ohlídal, Petr Klapetek: Mikroskopie magnetické síly: Aplikace při studiu pevných disků. Československý časopis pro fyziku, 54, (124-127), Praha, 2003.
  • Miloslav Ohlídal, Ivan Ohlídal, Petr Klapetek, Miloš Jákl, Vladimír Čudek, Marek Eliáš: New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters, Japanese Journal of Applied Physics, 42, (4760-4765), Tokyo, 2003.
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Optical constants of ZnTe and ZnSe epitaxial thin films, Acta Physica Slovaca, 2, (95-104), Bratislava, 2003.
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Optical characterization of ZnSe thin films, 19th Congress of the International Commission for Optics: Optics for the Quality of Life., (831-832), Bellingham, 2003.
  • Petr Klapetek, Ivan Ohlídal: Srovnání snímků NSOM a AFM při studiu vybraných objektů, Československý časopis pro fyziku, 6-7s, (79-81), Praha, 2003.
  • Petr Klapetek, Ivan Ohlídal: Theoretical analysis of the atomic force microscopy characterization of columnar thin films, Ultramicroscopy, 94, (19-29), Amsterdam, 2003.

    • 2002

  • Petr Klapetek, Ivan Ohlídal, Daniel Franta, Pavel Pokorný: Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method Surface and Interface Analysis, 34, (559-564), 2002.
  • Martin Šiler, Petr Klapetek, Ivan Ohlídal: Aplikace mikroskopie magnetické síly při studiu záznamového prostředí pevných disků, Jemná mechanika a optika, 47, (216-219), Přerov, 2002.
  • Petr Klapetek, Ivan Ohlídal, Daniel Franta: Applications of atomic force microscopy for thin film boundary measurements, Jemná mechanika a optika, 47, (195-199), Přerov, 2002.
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Pavel Pokorný: Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods, Surface and Interface Analysis, 34, (759-762), 2002.
  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Alberto Montaigne-Ramil, Alberta Bonanni, David Stifter, Helmut Sitter: Influence of overlayers on determination of the optical constants of ZnSe thin films, Journal of Applied Physics, 92, (1873-1880), 2002.

    • 2001

  • Daniel Franta, Ivan Ohlídal, Petr Klapetek, Pavel Pokorný, Miloslav Ohlídal: Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy, Surface and Interface Analysis, 32, (91-94), 2001.
  • Ivan Ohlídal, Daniel Franta, Petr Klapetek: Měření základních statistických veličin náhodné povrchové drsnosti pomocí mikroskopie atomové síly, Československý časopis pro fyziku, 1, (16-21), Praha, 2001.
  • Marek Eliáš, Vilma Buršíková, Lenka Zajíčková, Vít Kudrle, Petr Klapetek, Jan Janča: Preparation of enhanced CN-based hard coatings by PECVD, Proceedings of 15th International Symposium on Plasma Chemistry, (1913-1918), Orleans, 2001.
  • Petr Klapetek, Daniel Franta, Ivan Ohlídal: Study of Thin Film Defects by Atomic Force Microscopy, Proceedings of the 4th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods, (107-117), Braunschweig, 2001.
  • Petr Klapetek, Ivan Ohlídal, Daniel Franta: Vliv diskrétní Fourierovy transformace na zpracování AFM dat, Československý časopis pro fyziku, 1, (49-51), Praha, 2001.

    • 2000

  • Daniel Franta, Ivan Ohlídal, Petr Klapetek: Analysis of Slightly Rough Thin Films by Optical Methods and AFM, Mikrochim. Acta, 132, (443-447), Wien, 2000.
  • Ivan Ohlídal, Daniel Franta, Petr Klapetek: Atomic force microscopy measurements of surface roughness quantities important in optics of surfaces and thin films, Proceedings of the 4th Seminar on Quantitative Microscopy, (124-131), Braunscheig, 2000.

    • 1999

  • Ivan Ohlídal, Daniel Franta, Petr Klapetek, Martin Vičar: Relationship Between AFM and Optical Measurements at Analyzing Surface Roughness, Jemná mechanika a optika, 44, (307-311), Přerov, 1999.

    • 1998

  • Ivan Ohlídal, Daniel Franta, Martin Vičar, Petr Klapetek: Comparison of AFM and optical methods at measuring nanometric surface roughness Proceedings of the 3th Seminar on Quantitative Microscopy, (123-129), Braunschweig, 1998.

    • (c) CMI 2012

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    Contact

    Department of primary nanometrology and technical length
    Czech Metrology Institute
    Okružní 31, 638 00 Brno
    petr.klapetek(at)cmi.gov.cz