SPM measurements gallery

Nanometrologie.cz
  • 100nm nanospheres on silicon
  • AFM tips imaged on ZnSe film
  • Carbon nanotube (sample courtesy L. Zajickova)
  • Escherechia coli (sample courtesy L. Fojt)
  • MFM on hard disc
  • Microchip surface
  • Microchip surface thermal data
  • Nanoindentor imprint on copper
  • Nanoscratching on polycarbonate
  • Natural diamond (sample courtesy J. Kotkova)
  • Part of a CCD chip
  • PLC film delamination
  • Silicon single steps (sample courtesy L. Koenders)
  • SNOM reflection on Al islands
  • Thermal map on microchip sensor
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Contact

Department of primary nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
petr.klapetek(at)cmi.gov.cz