SPM measurements gallery

Nanometrologie.cz
  • 100nm nanospheres on silicon
  • AFM tips imaged on ZnSe film
  • Carbon nanotube (sample courtesy L. Zajickova)
  • Escherechia coli (sample courtesy L. Fojt)
  • MFM on hard disc
  • Microchip surface
  • Microchip surface thermal data
  • Nanoindentor imprint on copper
  • Nanoscratching on polycarbonate
  • Natural diamond (sample courtesy J. Kotkova)
  • Part of a CCD chip
  • PLC film delamination
  • Silicon single steps (sample courtesy L. Koenders)
  • SNOM reflection on Al islands
  • Thermal map on microchip sensor
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News

2020-02-28 New FDTD solver version GSvit 1.9.4 was released.

2019-06-11 New FDTD solver version GSvit 1.9.3 was released.

2019-10-12 New FDTD solver version GSvit 1.9.2 was released.

Image of the month


SiOx nanocomposite film deposited in dusty plasma

Contact

Department of nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
pklapetek(at)cmi.cz