SPM measurements gallery

Nanometrologie.cz
  • 100nm nanospheres on silicon
  • AFM tips imaged on ZnSe film
  • Carbon nanotube (sample courtesy L. Zajickova)
  • Escherechia coli (sample courtesy L. Fojt)
  • MFM on hard disc
  • Microchip surface
  • Microchip surface thermal data
  • Nanoindentor imprint on copper
  • Nanoscratching on polycarbonate
  • Natural diamond (sample courtesy J. Kotkova)
  • Part of a CCD chip
  • PLC film delamination
  • Silicon single steps (sample courtesy L. Koenders)
  • SNOM reflection on Al islands
  • Thermal map on microchip sensor
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(c) CMI 2012

News

Book of abstracts from SPM workshop 2025 in Lednice is available here.

Contact

Department of primary nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
petr.klapetek(at)cmi.gov.cz