Department of Nanometrology
Czech Metrology Institute
Okružní 31, 638 00 Brno

Please direct your inquires on the following employees:

PersonField of expertize
Mgr. Petr Klapetek, Ph.D.
head of Department of Nanometrology
e-mail: pklapetek (at)
quantitative SPM measurement, modeling using MD and FDTD, software development
Mgr. Miroslav Valtr, Ph.D.
e-mail: mvaltr (at)
AFM measurement, digital spectroscopic reflectometry, electronics development
Mgr. Anna Charvátová Campbell, Ph.D.
e-mail: acampbellova (at)
nano and microindentation, scratch testing, modeling using DFT and FEM, Monte Carlo uncertainty analysis
Mgr. Jan Martinek, Ph.D.
e-mail: jmartinek (at)
nano and microindentation, modeling using FEM, scanning thermal microscopy

Apart from ordinary employees we collaborate also with colleagues from different departments:

PersonField of expertize
Ing. Václav Duchoň
head of Length Department
e-mail: vduchon (at)
development of mechanical microsystems, measurement in the field of length
RNDr. Petr Balling
head of Department of Quantum Metrology of Lengt
e-mail: pballing (at)
traceability of length etalons, interferometry

Many other contacts can be found on the official web pages of the Czech Metrology Institute.

(c) CMI 2012


2019-10-12 New FDTD solver version GSvit 1.9.2 was released.

We invite you to our SPM workshop.

Image of the month

AFM scan of polystyrene (PSL) nanoparticles having 100 nm and 300 nm in diameter


Department of nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno