Contact

Department of Nanometrology
Czech Metrology Institute
Okružní 31, 638 00 Brno

Please direct your inquires on the following employees:

PersonField of expertize
Mgr. Petr Klapetek, Ph.D.
head of Department of Nanometrology
e-mail: pklapetek (at) cmi.cz
quantitative SPM measurement, MD and FDTD modelling, software development
Mgr. Anna Charvátová Campbell, Ph.D.
e-mail: acharvatovacampbell (at) cmi.cz
nano- a microindentation, scratch testing, DFT modelling, uncertainty analysis
Ing. Václav Duchoň
head of technical length section
e-mail: vduchon (at) cmi.cz
development of mechanical microsystems, measurements in the field of length
assoc. prof. Mgr. Jan Martinek, Ph.D.
e-mail: jmartinek (at) cmi.cz
scanning thermal microscopy, FEM modelling, electronics development
Mgr. Radek Šlesinger, Ph.D.
e-mail: rslesinger (at) cmi.cz
nano- a microindentation, FEM and MPM modelling, software development
Mgr. Jiří Šperka, Ph.D.
e-mail: jsperka (at) cmi.cz
nanoparticle and aerosol measurement, digital spectroscopic reflectometry, electronics development
Mgr. Miroslav Valtr, Ph.D.
e-mail: mvaltr (at) cmi.cz
AFM measurement, digitální spektroskopická reflektometrie, vývoj elektroniky

Apart from our team members we also collaborate with colleagues from other departments:

PersonField of expertize
RNDr. Petr Balling
head of Department of Quantum Metrology of Length
e-mail: pballing (at) cmi.cz
traceability of length etalons, interferometry

Many other contacts can be found on the official web pages of the Czech Metrology Institute.


(c) CMI 2020

News

2020-02-28 New FDTD solver version GSvit 1.9.4 was released.

2019-06-11 New FDTD solver version GSvit 1.9.3 was released.

2019-10-12 New FDTD solver version GSvit 1.9.2 was released.

Image of the month


SiOx nanocomposite film deposited in dusty plasma

Contact

Department of nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
pklapetek(at)cmi.cz