Contact
Department of Nanometrology Czech Metrology Institute Okružní 31, 638 00 Brno
Please direct your inquires on the following employees:
Person | Field of expertize |
Mgr. Petr Klapetek, Ph.D. head of Department of Nanometrology e-mail: petr.klapetek (at) cmi.gov.cz |
quantitative SPM measurement, MD and FDTD modelling, software development |
Mgr. Anna Charvátová Campbell, Ph.D. e-mail: acharvatovacampbell (at) cmi.gov.cz |
nano- a microindentation, scratch testing, DFT modelling, uncertainty analysis |
Ing. Václav Duchoň head of technical length section e-mail: vaclav.duchon (at) cmi.gov.cz |
development of mechanical microsystems, measurements in the field of length |
assoc. prof. Mgr. Jan Martinek, Ph.D. e-mail: jan.martinek (at) cmi.gov.cz |
scanning thermal microscopy, FEM modelling, electronics development |
Mgr. Radek Šlesinger, Ph.D. e-mail: radek.slesinger (at) cmi.gov.cz |
nano- a microindentation, FEM and MPM modelling, software development |
Mgr. Miroslav Valtr, Ph.D. e-mail: miroslav.valtr (at) cmi.gov.cz |
AFM measurement, digitální spektroskopická reflektometrie, vývoj elektroniky |
Apart from our team members we also collaborate with colleagues from other departments:
Person | Field of expertize |
RNDr. Petr Balling head of Department of Quantum Metrology of Length e-mail: petr.balling (at) cmi.gov.cz |
traceability of length etalons, interferometry |
Many other contacts can be found on the official web pages of the Czech Metrology Institute.
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