Contact

Department of Nanometrology
Czech Metrology Institute
Okružní 31, 638 00 Brno

Please direct your inquires on the following employees:

PersonField of expertize
Mgr. Petr Klapetek, Ph.D.
head of Department of Nanometrology
e-mail: pklapetek (at) cmi.cz
quantitative SPM measurement, MD and FDTD modelling, software development
Mgr. Anna Charvátová Campbell, Ph.D.
e-mail: acharvatovacampbell (at) cmi.cz
nano- a microindentation, scratch testing, DFT modelling, uncertainty analysis
Ing. Václav Duchoň
head of technical length section
e-mail: vduchon (at) cmi.cz
development of mechanical microsystems, measurements in the field of length
assoc. prof. Mgr. Jan Martinek, Ph.D.
e-mail: jmartinek (at) cmi.cz
scanning thermal microscopy, FEM modelling, electronics development
Mgr. Radek Šlesinger, Ph.D.
e-mail: rslesinger (at) cmi.cz
nano- a microindentation, FEM and MPM modelling, software development
Mgr. Jiří Šperka, Ph.D.
e-mail: jsperka (at) cmi.cz
nanoparticle and aerosol measurement, digital spectroscopic reflectometry, electronics development
Mgr. Miroslav Valtr, Ph.D.
e-mail: mvaltr (at) cmi.cz
AFM measurement, digitální spektroskopická reflektometrie, vývoj elektroniky

Apart from our team members we also collaborate with colleagues from other departments:

PersonField of expertize
RNDr. Petr Balling
head of Department of Quantum Metrology of Length
e-mail: pballing (at) cmi.cz
traceability of length etalons, interferometry

Many other contacts can be found on the official web pages of the Czech Metrology Institute.


(c) CMI 2020

News

2024-1-04 New SPM data analysis software version Gwyddion 2.65 was released.

Contact

Department of nanometrology and technical length
Czech Metrology Institute
Okružní 31, 638 00 Brno
pklapetek(at)cmi.cz