Xraytrace documentation

Xraytrace was built to be able to handle various second-order effects in X-ray standing wave (XSW) based measurement. XSW technique is based on total external reflection of x-rays on a sample surface, which leads to formation of a standing wave above surface. By changing the incident angle we can change the period of the standing wave which can be used for profiling the objects on the surface.

The simplest way how to handle XSW data is to use simple analytical models, based on incident beam angle and wavelength. This can be tested further using our online tool. The measurements are done at very small angles, so it is quite likely that rays pass through multiple objects on surface. This can lead to some more complicated effects that geometrical optics calculations can cover. This is aim of Xraytrace.

Material properties in Xraytrace

Xraylib online calculator

Some critical angles list