Xraytrace documentation

Continuous layers on which the TER happens on the top surface. Only evanescent wave is probing the material volume below the critical angle. This is easy for the simple semi-analytical model (set the SIMPLE directive to 1) and very challenging for the raytracing model.

Here we show experimental data and calculation results for 12 nm of nickel film on silicon measured with 9 keV incident beam energy, i.e. 0.13776 nm wavelength.

The experimental data, measured at PTB, look like this after normalization:

With these parameter files we have obtained the following result (for the semi-analytical model only):