Xraytrace documentation

Xraytrace was built to be able to handle various second-order effects in X-ray standing wave (XSW) based measurement. XSW technique is based on total external reflection of x-rays on a sample surface, which leads to formation of a standing wave above surface. By changing the incident angle we can change the period of the standing wave which can be used for profiling the objects on the surface.

The simplest way how to handle XSW data is to use simple analytical models, based on incident beam angle and wavelength. This can be tested further using our online tool from older Xraytrace pages (the simple model is a subset of computing options in Xraytrace). The measurements are done at very small angles, so it is quite likely that rays pass through multiple objects on surface. This can lead to some more complicated effects that geometrical optics calculations can cover. For some basic geometries this was already very successful approach in the literature, and goal of Xraytrace is to extend this approach for arbitrary geometries.

Material properties in Xraytrace are computed using Xraylib, so one might be interested in Xraylib online calculator or discussion and list of some critical angles.