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nickel_film [2018/01/27 13:41] pklapetek |
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| Continuous layers on which the TER happens on the top surface. Only evanescent wave is probing the material volume below the critical angle. This is easy for the simple semi-analytical model (set the SIMPLE directive to 1) and very challenging for the raytracing model. | Continuous layers on which the TER happens on the top surface. Only evanescent wave is probing the material volume below the critical angle. This is easy for the simple semi-analytical model (set the SIMPLE directive to 1) and very challenging for the raytracing model. | ||
| - | 12 nm of nickel on silicon, 9 keV energy, 0.13776 nm wavelength. | + | Here we show experimental data and calculation results for 12 nm of nickel film on silicon measured with 9 keV incident beam energy, i.e. 0.13776 nm wavelength. |
| The experimental data, measured at PTB, look like this after normalization: | The experimental data, measured at PTB, look like this after normalization: | ||
| {{ :ni.png?400 |}} | {{ :ni.png?400 |}} | ||
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| + | With {{samples:nickel_simple.tar.gz|these parameter files}} we have obtained the following result (for the semi-analytical model only): | ||
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| + | {{ :ni_simple.png?400 |}} | ||
nickel_film.1517056885.txt.gz ยท Last modified: 2018/01/27 13:41 by pklapetek
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