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--- nickel_film [2018/01/27 09:26]
pklapetek created
+++ nickel_film [2018/01/27 14:30] (current)
pklapetek
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 ===== Nickel film =====
+Continuous layers on which the TER happens on the top surface. Only evanescent wave is probing the material volume below the critical angle. This is easy for the simple semi-analytical model (set the SIMPLE directive to 1) and very challenging for the raytracing model.
+Here we show experimental data and calculation results for 12 nm of nickel film on silicon measured with 9 keV incident beam energy, i.e. 0.13776 nm wavelength.
+The experimental data, measured at PTB, look like this after normalization:
+{{ :ni.png?400 |}}
+With {{samples:nickel_simple.tar.gz|these parameter files}} we have obtained the following result (for the semi-analytical model only):
+{{ :ni_simple.png?400 |}}

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